ASTM F980-10e1
- standard by ASTM International, 12/01/2010
- Standard Guide for Measurement of Rapid Annealing of Neutron-Induced Displacement Damage in Silicon Semiconductor Devices
- Category: ASTM
$58.00
$29.00
Product Details
- Published:
- 12/01/2010
- Number of Pages:
- 7
- File Size:
- 1 file , 160 KB
- Note:
- This product is unavailable in Russia, Ukraine, Belarus
Document History
